Amazon CloudWatch now supports high resolution metric extraction from structured logs

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Amazon CloudWatch now supports high resolution metric extraction from structured logs

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Amazon CloudWatch now supports high resolution metric extraction with up to 1 second granularity from structured logs using Embedded Metric Format (EMF). Customers can now provide an optional “StorageResolution” parameter within EMF specification logs with a value of 1 or 60 (default) to indicate the desired resolution (in seconds) of the metric. 


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